Electrical Metrology

Current-Voltage Measurements

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  • as a function of temperature (77K - 500K)

  • contact resistance measurements

  • metal contacts optimization

  • conduction mechanisms understanding

Hall Effect Measurements

Mobility vs. temperature, scattering mechanisms
Mobility vs. temperature, scattering mechanisms

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Temperature dependent Hall effect
Temperature dependent Hall effect

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Shubnikov-de-Haas effect
Shubnikov-de-Haas effect

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Mobility vs. temperature, scattering mechanisms
Mobility vs. temperature, scattering mechanisms

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  • as a function of temperature (77K - 500K)

  • mobility, carrier density measurements

  • type of carriers measurements

  • identification of shallow donors/acceptors

  • conduction mechanisms understanding

  • scattering mechanisms understanding

  • magnetoresistance measurements

  • Hall effect under light excitations

Deep Level Noise Spectroscopy

  • as a function of temperature (77K - 500K)

  • noise spectra as a function of bias current

  • contact noise measurements

  • bulk noise measurements

  • defects probing: activation energy, defects density, capture cross section

Noise Spectrum
Noise Spectrum

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Noise spectra vs. frequency and temperature
Noise spectra vs. frequency and temperature

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Activation energy
Activation energy

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Noise Spectrum
Noise Spectrum

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