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Optical Metrology

Photoluminescence

  • as a function of temperature (10K - 300K)

  • as a function of laser excitation wavelength (532 nm, 750 nm - 900 nm)

  • as a function of laser excitation intensity

  • material quality evaluation

  • band structure and radiative recombination processes understanding

  • material uniformity across the wafer

Time-Resolved Photoluminescence

Time Resolved.jpg

  • as a function of temperature (10K - 300K)

  • as a function of laser excitation wavelength (750 nm - 850 nm)

  • as a function of laser excitation intensity

  • PL decay time (20 ps - 2.5 ns)

  • carrier lifetime measurements

  • understanding of carrier recombination phenomena

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