Technical Specifications
e-mail: info@transient-tech.com phone: +1 (916) 514-8596
Transient Signal Technologies
advanced materials metrology
Current-Voltage Measurement Systems
Transient Signal Technologies proudly joins the Keysight Solution Partner program
​Features
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Current-voltage (I-V) measurements ​are critical for the characterization of any semiconductor device. These measurements are always considered as a first step prior to complex electrical transport studies of semiconductor materials. Measurements and analysis of I-V curves are helpful in understanding conduction mechanisms in semiconductor devices and at the metal-semiconductor interfaces. In general, two, three, or four-terminal measurements are considered. Different device bias conditions can be required, such as DC or pulse measurements.​
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​Transient Signal Technologies offers I-V measurement systems capable of operating at both room temperature and variable temperatures, equipped with Keysight Source-Measure Units. These systems support two-point and four-point probe measurement techniques in both DC and pulse modes. Both biasing modes are available: applying a bias voltage and measuring current or applying a bias current and measuring voltage. Additionally, a range of sweep waveforms can be used in either measurement mode, including fixed level, linear stair, linear stair pulse, and more.
The I-V measurement systems can be equipped with a Keysight Parametric Test Fixture, Model U2941A. This test fixture allows easy access to semiconductor device terminals or samples by use of socket boards, necessary interconnects to test input/output terminals of Keysight SMU. Low noise, low-level electrical signal measurements are possible by use of coaxial connectors.
Variable temperature I-V measurement systems (80 K - 700 K) and room temperature I-V measurement systems are available with vacuum probe stations and high-precision, high-frequency micromanipulators. The number of manipulators can be configured at the time of purchase, with options for up to seven manipulators per probe station. Additionally, we offer micromanipulators equipped with fiber optics (UV or IR) for I-V measurements under light excitation.
I-V measurement systems come with a Dell desktop computer and a 22" wide LCD monitor. SMU control and data acquisition are managed through either a USB or GPIB interface. High-precision temperature control is achieved using a liquid nitrogen continuous flow stage (80 K - 500 K) or a hot stage (300 K - 700 K) paired with a DC600 temperature controller. Two independent software packages are provided: EasyEXPERT software for Keysight SMU control on PC, and software for DC600 control. LabView drivers are also available for custom system development.